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专利名称:Apparatus and method for measuring
suspension and head assemblies in a stack
发明人:Mark T. Girard,Joseph P. Tracy,Ryan A.
Jurgenson,David R. Swift
申请号:US11713550申请日:20070302
公开号:US20080212107A1公开日:20080904
专利附图:
摘要:An optical measurement device for determining at least two parameters of ameasurement location of a surface of at least one workpiece positioned in a known
coordinate system is described. The device comprises a first light source providing a firstmeasurement beam. The first measurement beam is directed at a first surface of aworkpiece. The device also comprises a second light source providing a second
measurement beam. The second measurement beam is directed at a second surface of aworkpiece facing opposite the first surface. Further, the device comprises a first systemof receiving optics. The first system of receiving optics detects the incoming position ofthe first measurement beam. The first system of receiving optics is positioned on anopposite side of a workpiece from the first light source. Further still, the devicecomprises a second imaging system. The second system of receiving optics detects theincoming position of the second measurement beam. The second system of receivingoptics is positioned on an opposite side of a workpiece from the second light source.
申请人:Mark T. Girard,Joseph P. Tracy,Ryan A. Jurgenson,David R. Swift
地址:Hutchinson MN US,Hutchinson MN US,Hutchinson MN US,Glencoe MN US
国籍:US,US,US,US
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