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System and method for evaluating high frequency ti

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专利名称:System and method for evaluating high

frequency time domain in embedded deviceprobing

发明人:Joseph Curtis Diepenbrock,Roland Frech申请号:US12185930申请日:20080805公开号:US08000916B2公开日:20110816

专利附图:

摘要:A system and associated method for evaluating a high-frequency signal at apoint of interest on a signal path from a remote signal at a remote pickup point on the

signal path. The point of interest is located on a device under test that is coupled to testequipment via the signal path. The high-frequency signal at the point of interest iscalculated from the remote signal at the remote pickup point with an inverse transferfunction that eliminates degradation effects on the high-frequency signal that istransferred through the signal path. The inverse transfer function may be calculatedfrom measurements acquired in a test signal transfer through a reference path thatsimulates electrical properties of the signal path, or configured to a predeterminedfunction if electrical properties of the signal path are known.

申请人:Joseph Curtis Diepenbrock,Roland Frech

地址:Raleigh NC US,Ostfildern DE

国籍:US,DE

代理机构:Schmeiser, Olsen & Watts

代理人:Randall Bluestone

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