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专利名称：Device for testing and calibrating the
oscillation frequency of an integratedoscillator
发明人：Alessandro Rocchi,Marco Bisio,Guido De
Sandre,Giovanni Guaitini,Marco Pasotti,PierLuigi Rolandi
申请号：US09833754申请日：20010411
公开号：US20010044702A1公开日：20011122
摘要：A digital device for testing and calibrating the oscillation frequency of anintegrated oscillator, integrated in an integrated circuit of a type that includes at leastone storage and control section, a plurality of connection pins connected bidirectionallyto the storage and control section, and an external generator delivering a referencesignal of known duration to at least a first digital input pin of the plurality of connectionpins. The testing and calibrating device has as input at least first and second controlparameters corresponding to limiting values of a predetermined range of values of theoscillation frequency sought for the integrated oscillator circuit, and it includes a circuitfor comparing the signal of known duration and the signal from the integrated oscillatorcircuit; a circuit connected to the compare means, for generating calibration values forthe signal from the integrated oscillator circuit; and a circuit for forcing storage of finalcalibration values of the signal from the integrated oscillator circuit into the storage andcontrol section.
申请人：ROCCHI ALESSANDRO,BISIO MARCO,DE SANDRE GUIDO,GUAITINIGIOVANNI,PASOTTI MARCO,ROLANDI PIER LUIGI
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