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专利名称：Device for testing and calibrating the
oscillation frequency of an integratedoscillator
发明人：Alessandro Rocchi,Marco Bisio,Guido De
Sandre,Giovanni Guaitini,Marco Pasotti,PierLuigi Rolandi
申请号：US09833754申请日：20010411公开号：US06622106B2公开日：20030916
专利附图：
摘要：A digital device for testing and calibrating the oscillation frequency of anintegrated oscillator circuit, the testing and calibrating device has as input at least firstand second control parameters corresponding to limiting values of a predeterminedrange of values of the oscillation frequency sought for the integrated oscillator circuit,and it includes a comparison circuit for comparing a signal of known duration and a signalfrom the integrated oscillator circuit; a circuit connected to the comparison circuit, forgenerating calibration values for the signal from the integrated oscillator circuit; and acircuit for forcing storage of final calibration values of the signal from the integratedoscillator circuit into a storage and control section of the integrated oscillator circuit.
申请人：STMICROELECTRONICS S.R.L.
代理机构：SEED IP Law Group PLLC
代理人：Lisa K. Jorgenson,E. Russell Tarleton
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